Artificial neural network design for compact modeling of generic transistors

A methodology to develop artificial neural network (ANN) models to quickly incorporate the characteristics of emerging devices for circuit simulation is described in this work. To improve the model accuracy, a current and voltage data preprocessing scheme is proposed to derive a minimum dataset to train the ANN model with sufficient accuracy. To select a proper network size, four guidelines are developed from the principles of two-layer network. With that, a reference ANN size is proposed as a generic three-terminal transistor model. The ANN model formulated using the proposed approach has been verified by physical device data. Both the device and circuit-level tests show that the ANN model can reproduce and predict various device and circuits with high accuracy.

[1]  Simon Haykin,et al.  Neural Networks: A Comprehensive Foundation , 1998 .

[2]  George Cybenko,et al.  Approximation by superpositions of a sigmoidal function , 1992, Math. Control. Signals Syst..

[3]  Andrew R. Barron [Neural Networks: A Review from Statistical Perspective]: Comment , 1994 .

[4]  Y. Tsividis Operation and modeling of the MOS transistor , 1987 .

[5]  M.C.E. Yagoub,et al.  Exact adjoint sensitivity analysis for neural based microwave modeling and design , 2001, 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157).

[6]  C. C. McAndrew,et al.  Practical modeling for circuit simulation , 1998, IEEE J. Solid State Circuits.

[7]  Mansun Chan,et al.  SPICE Modeling of Double-Gate Tunnel-FETs Including Channel Transports , 2014, IEEE Transactions on Electron Devices.

[8]  D. E. Root,et al.  Future Device Modeling Trends , 2012, IEEE Microwave Magazine.

[9]  Mansun Chan,et al.  A physical and scalable I-V model in BSIM3v3 for analog/digital circuit simulation , 1997 .

[10]  D. M. Titterington,et al.  Neural Networks: A Review from a Statistical Perspective , 1994 .

[11]  A. Khakifirooz,et al.  A Simple Semiempirical Short-Channel MOSFET Current–Voltage Model Continuous Across All Regions of Operation and Employing Only Physical Parameters , 2009, IEEE Transactions on Electron Devices.

[12]  David E. Root,et al.  Nonlinear Transistor Model Parameter Extraction Techniques: The large-signal model: theoretical foundations, practical considerations, and recent trends , 2011 .