论文信息 - Determination of amount of substance for nanometre‐thin deposits: consistency between XPS, RBS and XRF quantification - 字舞流文

Determination of amount of substance for nanometre‐thin deposits: consistency between XPS, RBS and XRF quantification

F. Yubero | J. P. Espinós | S. Tougaard | S. Tougaard | A. I. Martin-Concepción | A. Martín‐Concepción | J. García-López | J. Espinós