论文信息 - Modelling of DNA damage induced by energetic electrons (100 eV to 100 keV). - 字舞流文

Modelling of DNA damage induced by energetic electrons (100 eV to 100 keV).

D. Goodhead | P. O'Neill | H. Nikjoo | R. Watanabe | M. Terrissol | C. E. Bolton | Ritsuko Watanabe | Peter O'Neill