Spectral optical functions of silicon in the range of 1.13-4.96 eV at elevated temperatures
暂无分享,去创建一个
Costas P. Grigoropoulos | Xiang Zhang | C. Grigoropoulos | X. Zhang | Byung K. Sun | B. K. Sun | Xiang Zhang
[1] Emil Wolf,et al. Principles of Optics: Contents , 1999 .
[2] I. Malitson. Interspecimen Comparison of the Refractive Index of Fused Silica , 1965 .
[3] N. Draper,et al. Applied Regression Analysis , 1966 .
[4] A. S. Grove. Physics and Technology of Semiconductor Devices , 1967 .
[5] N. C. Hien,et al. Design and operation of an automated, high-temperature ellipsometer , 1974 .
[6] D. Aspnes. Optimizing precision of rotating-analyzer ellipsometers , 1974 .
[7] B. Seraphin. Optical Properties of Solids: New Developments , 1976 .
[8] A. J. Barker. Optical Properties of Solids-New Developments , 1976 .
[9] R. Azzam,et al. Ellipsometry and polarized light , 1977 .
[10] K. Kondo,et al. Optical critical-point structures of Si: Symmetry analysis by low-field electroreflectance , 1977 .
[11] A. Daunois,et al. Electroreflectance and ellipsometry of silicon from 3 to 6 eV , 1978 .
[12] E. Taft,et al. Optical Evidence for a Silicon‐Silicon Oxide Interlayer , 1979 .
[13] D. Aspnes,et al. Optical Properties of the Interface between Si and Its Thermally Grown Oxide , 1979 .
[14] Norman R. Draper,et al. Applied regression analysis (2. ed.) , 1981, Wiley series in probability and mathematical statistics.
[15] G. Jellison,et al. Optical constants for silicon at 300 and 10 K determined from 1.64 to 4.73 eV by ellipsometry , 1982 .
[16] Gerald Earle Jellison,et al. Optical functions of silicon between 1. 7 and 4. 7 eV at elevated temperatures , 1983 .
[17] Gerald Earle Jellison,et al. The temperature dependence of the refractive index of silicon at elevated temperatures at several laser wavelengths , 1986 .
[18] K. Riedling. Ellipsometry for industrial applications , 1987 .
[19] C. Grigoropoulos,et al. High temperature radiative properties of thin polysilicon films at the λ = 0.6328 μm wavelength , 1993 .