China Test Conference (CTC) - Extending the Global Test Forum to China

The year of 2019 marks the 50th IEEE International Test Conference (ITC) - the world's first and premier conference dedicated to electronic test technology. As one of the participating conferences of the ITC global test forum (GTF), China Test Conference (CTC) was invited to join the celebration of the ITC's 50th anniversary. CTC was initiated in Beijing by the test community in China in year of 2000, in the background that China began to highly encourage the developing of its integrated circuit (IC) industry, while test plays a major role in guaranteeing IC's quality and reliability. CTC has been held biennially for ten times and been included into the technical meetings of the IEEE Computer Society Test Technology Technical Council (TTTC). It has been a connection of the test community in China with the international test communities and conferences. The 10th CTC was very successful and was selected as the TTTC Affiliated Most Populous Technical Meeting in 2018.