Using short-term fourier transform for particle detection and recognition in a CMOS oscillator-based chain

The development of a new methodology based on Short-Term Fourier Transform (STFT) to detect and track particles is presented. The methodology is investigated based on an CMOS oscillator detection chain optimized for identification of low particle fluxes. The evaluation of the circuit sensitivity to radiation is performed by measuring and processing the oscillator response. In the presented approach, the oscillator output signal is processed using the STFT technique. The CMOS detector is based on SOI technology making it tolerant to radiations.

[1]  E. Normand.  Single-event effects in avionics , 1996 .

[2]  M. Campbell,et al.  Charge collection from proton and alpha particle tracks in silicon pixel detector devices , 2007, 2007 IEEE Nuclear Science Symposium Conference Record.

[3]  G. Micolau,et al.  Comparison of a Readout Chain Dedicated to the Signal Conditioning of a Particle Detector and an Innovative Chain Based on a VCO Concept , 2015, 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

[4]  R. Reed,et al.  The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets , 2011, IEEE Transactions on Nuclear Science.

[5]  G. Micolau,et al.  Development of a CMOS Oscillator Concept for Particle Detection and Tracking , 2013, IEEE Transactions on Nuclear Science.

[6]  Antoine D. Touboul,et al.  Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model , 2013, Microelectron. Reliab..

[7]  F. Saigne,et al.  Charge Sharing Study in the Case of Neutron Induced SEU on 130 nm Bulk SRAM Modeled by 3-D Device Simulation , 2006, IEEE Transactions on Nuclear Science.

[8]  L. Verducci,et al.  High-resolution CMOS particle detectors: design and test issues , 2003, 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515).

[9]  R. Baumann.  Soft errors in advanced semiconductor devices-part I: the three radiation sources , 2001 .

[10]  Fernanda Gusmão de Lima Kastensmidt,et al.  Accurate and computer efficient modelling of single event transients in CMOS circuits , 2007, IET Circuits Devices Syst..

[11]  Ronald W. Schafer,et al.  Design and simulation of a speech analysis-synthesis system based on short-time Fourier analysis , 1973 .

[12]  Ralf Nolte,et al.  Calibration of a neutron detector based on single event upset of SRAM memories , 2010 .

[13]  Ritesh Mastipuram,et al.  Soft errors ' impact on system reliability , 2019 .