Simulated Annealing for Mixture Distribution Analysis and its Applications to Reliability Testing
暂无分享,去创建一个
[1] Cher Ming Tan,et al. Electromigration in ULSI Interconnections , 2010, International Series on Advances in Solid State Electronics and Technology.
[2] William H. Press,et al. Numerical recipes in C. The art of scientific computing , 1987 .
[3] Ulrich W. Thonemann,et al. Optimizing simulated annealing schedules with genetic programming , 1996 .
[4] Cher Ming Tan,et al. Statistical Analysis of Multi-Censored Electromigration Data using the EM Algorithm , 2007, 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
[5] Cher Ming Tan,et al. Unveiling the electromigration physics of ULSI interconnects through statistics , 2007 .
[6] H. Akaike. A new look at the statistical model identification , 1974 .
[7] Cher Ming Tan,et al. An approach to statistical analysis of gate oxide breakdown mechanisms , 2007, Microelectron. Reliab..
[8] Matija Fajdiga,et al. Reliability approximation using finite Weibull mixture distributions , 2004, Reliab. Eng. Syst. Saf..
[10] R. Degraeve,et al. A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown , 1998 .
[11] S. Brooks,et al. Optimization Using Simulated Annealing , 1995 .
[12] William L. Goffe,et al. SIMANN: FORTRAN module to perform Global Optimization of Statistical Functions with Simulated Annealing , 1992 .
[13] Yuan Taur,et al. Fundamentals of Modern VLSI Devices , 1998 .
[14] Cher Ming Tan,et al. Application of gamma distribution in electromigration for submicron interconnects , 2007 .
[15] Xin Yao,et al. A new simulated annealing algorithm , 1995, Int. J. Comput. Math..
[16] Edgar N. Reyes,et al. Optimization using simulated annealing , 1998, Northcon/98. Conference Proceedings (Cat. No.98CH36264).
[17] Dimitri Kececioglu,et al. Maximum likelihood estimates, from censored data, for mixed-Weibull distributions , 1992 .
[18] Ephraim Suhir. Accelerated life testing (ALT) in microelectronics and photonics: its role, attributes, challenges, pitfalls, and interaction with qualification tests , 2002, SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring.
[19] A. F. Smith,et al. Statistical analysis of finite mixture distributions , 1986 .
[20] Charles E Ebeling,et al. An Introduction to Reliability and Maintainability Engineering , 1996 .
[21] P. A. Bennett. Practical Reliability Engineering , 1982 .
[22] B. Suman,et al. A survey of simulated annealing as a tool for single and multiobjective optimization , 2006, J. Oper. Res. Soc..
[23] William Q. Meeker,et al. Pitfalls of accelerated testing , 1998 .