论文信息 - GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse - 字舞流文

GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse

A. Gerosa | M. Meneghini | G. Meneghesso | H. Blanck | F. Rampazzo | E. Zanoni | C. D. Santi | B. Lambert | K. Mukherjee | F. Chiocchetta | J. Grünenpütt | D. Sommer