AnEfficient Design-for-testa bility Schemefor2-D Transform inH.264Advanced VideoCoders

Inthispaper, aneasily design-for-testability (DfT) schemebasedon C-testability conditions isadoptedto implement testsyntheses ofthe2-Dforward, inverse and Hadamardtransforms suggested inH.264advanced video coders (AVC). Theproposed testable schemeisapplied tobit- level regular arrangement forthetransform architecture. It guarantees 100%fault coverage while theresulting numberof test pattern isonly8.Theproposed integrated transforms have beensynthesized withUMC 0.18gmtechnology. Underthe smallperformance degradation, simulation results showthat theDfITimplementation increases aboutonly12% area overhead compared withtheoriginal circuit.