论文信息 - Trap Capture and Emission Dynamics in Ferroelectric Field-Effect Transistors and their Impact on Device Operation and Reliability - 字舞流文

Trap Capture and Emission Dynamics in Ferroelectric Field-Effect Transistors and their Impact on Device Operation and Reliability

Zheng Wang | Shimeng Yu | S. Kurinec | S. Datta | K. Ni | M. Passlack | G. Leusink | R. Clark | A. Khan | W. Chern | K. Tapily | N. Upadhyay | D. Triyoso | S. Consiglio | J. Hur | N. Tasneem | Zijian Zhao | S. Lombardo | Hang Chen