A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST

In this paper a joint implementation of a parity preserving multi-input signature analyzer (PMISA) and a parity checker is described. The PMISA simultaneously can be used for concurrent checking and for testing of digital circuits. In the case of concurrent checking errors are detected by their erroneous parity. If a circuit is tested errors are detected either by their erroneous parity or by the erroneous signature of the PMISA. A possible scan-mode of the PMISA allows its application in a scan path with parity-encoded inputs and outputs of the combinational modules which are driven by register sets. In normal operation mode all the registers of the PMISA can be utilized as functional registers of the combinational circuit.

[1]  Michael Gössel,et al.  Self-testing and self-checking combinational circuits with weakly independent outputs , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.

[2]  Michael Nicolaidis,et al.  Self-exercising checkers for unified built-in self-test (UBIST) , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[3]  Dhiraj K. Pradhan,et al.  Utilization of On-Line (Concurrent) Checkers During Built-In-Self-Test and Vice Versa , 1996, IEEE Trans. Computers.

[4]  Akihiro Yamamoto,et al.  Parity-scan design to reduce the cost of test application , 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[5]  E. S. Sogomonyan,et al.  Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs , 1993, J. Electron. Test..

[6]  Niraj K. Jha,et al.  DESIGN OF TOTALLY SELF-CHECKING EMBEDDED CHECKERS. , 1984 .

[7]  Dhiraj K. Pradhan,et al.  Store Address Generator with On-Line Fault-Detection Capability , 1977, IEEE Transactions on Computers.

[8]  Eiji Fujiwara,et al.  Error-control coding for computer systems , 1989 .

[9]  Eiji Fujiwara,et al.  A Self-Testing Group-Parity Prediction Checker and Its Use for Built-In Testing , 1984, IEEE Transactions on Computers.

[10]  Dhiraj K. Pradhan,et al.  SHIFT REGISTERS DESIGNED FOR ON-LINE FAULT DETECTION , 1995, Twenty-Fifth International Symposium on Fault-Tolerant Computing, 1995, ' Highlights from Twenty-Five Years'..

[11]  Robert K. Brayton,et al.  MIS: A Multiple-Level Logic Optimization System , 1987, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[12]  Premachandran R. Menon,et al.  Multi-level Logic Optimization By Implication Analysis , 1994, IEEE/ACM International Conference on Computer-Aided Design.

[13]  S.K. Gupta,et al.  Can concurrent checkers help BIST? , 1992, Proceedings International Test Conference 1992.

[14]  Andrzej Krasniewski,et al.  Circular self-test path: a low-cost BIST technique for VLSI circuits , 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[15]  Akihiro Yamamoto,et al.  Parity-Scan Design to Reduce the Cost of Test Application , 1992, Proceedings International Test Conference 1992.

[16]  B. Koenemann,et al.  Built-in logic block observation techniques , 1979 .

[17]  Edward J. McCluskey,et al.  Synthesizing for scan dependence in built-in self-testable designs , 1993, Proceedings of IEEE International Test Conference - (ITC).

[18]  Dong Sam Ha,et al.  On using signature registers as pseudorandom pattern generators in built-in self-testing , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[19]  Michael Nicolaidis A unified built-in-test scheme: UBIST , 1988, [1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers.

[20]  Michael Gössel,et al.  Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design , 1994, Proceedings of IEEE VLSI Test Symposium.