Determination of Microwave Two-Port Noise Parameters Through Computer-Aided Frequency-Conversion Techniques

A method to determine noise parameters of microwave linear two-ports (transistors) is presented which is based on a two-channel noise temperature measuring system and an analycal data procesing procedure. As compared with the one-channel measurements and the graphical processing techniques, the method offers advantages from both accuracy and experiment viewpoints. Experimental verification related to noise parameters determination for a microwave transistor as function of frequency in S band are reported.