论文信息 - Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies - 字舞流文

Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

A. Kohyama | C. Teichert | T. Nozawa | W. Skorupa | J. Kuriplach | G. Brauer | I. Procházka | F. Eichhorn | J. Čížek | W. Anwand | C. Hofer | P. Coleman