Experiments and modeling to determine trapped holes and slow states in Fowler-Nordheim stressed MOS capacitors
暂无分享，去创建一个
[1] Discharge of trapped electrons from MOS structures , 1980 .
[2] D. J. Breed. A new model for the negative voltage instability in MOS devices , 1975 .
[3] D. Arnold,et al. Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon , 1993 .
[4] B. Sagnes,et al. SURFACE POTENTIAL DETERMINATION IN METAL-OXIDE-SEMICONDUCTOR CAPACITORS , 1994 .