Electrical properties of TiO 2 -based MIM capacitors deposited by TiCl 4 and TTIP based atomic layer deposition processes
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C. Hwang | J. Han | J. Aarik | Seul Ji Song | Woongkyu Lee | B. Hudec | A. Tarre | A. Kasikov | K. Fröhlich | A. Rosová | Sora Han | K. Hušeková | S. Han