Real-time measurement of microscopic surface shape using high-speed cameras with continuously scanning interference microscopy

Currently the use of white light interference microscopy for measuring static 3D surface shape typically involves the "snapshot" approach, comprising the pressing of a button and waiting for the 3D "photo". For a standard image acquisition rate of 25 to 60 i/s, the time to result can vary from a few seconds to a few minutes, depending on the depth. Deeper and larger area structures such as those of MOEMS micro-systems can take many minutes. In this work we develop the concept of real time 3D measurement (4D) of non-periodic movement by means of high speed image acquisition and processing. A dedicated high speed CCD camera and FPGA (1 million gates) imaging board processes images 512x512 pixels in size (10 bits) at a rate of 250 i/s, and displays 3D images at up to 5 i/s. A second system based on a CMOS camera has also been tested at acquisition rates of 1017 i/s, but in this case with post processing. The move from "snapshot" to "video" leads to several advantages, such as easier system optimization, higher speed measurement and new applications in the areas of the analysis of moving parts, surface chemical reactions and fragile materials.

[1]  Manuel Flury,et al.  Rapid prototyping of diffractive optical elements for high-power lasers using laser ablation lithography fabrication and coherence probe microscopy analysis , 2002 .

[2]  Yann Reibel Développement et caractérisation d'une caméra vidéo numérique rapide (500 I/S) à haute résolution (10 BITS) : application à la reconstruction 3D de surfaces microscopiques , 2001 .

[3]  A C Boccara,et al.  Real-time reflectivity and topography imagery of depth-resolved microscopic surfaces. , 1999, Optics letters.

[4]  Kieran G. Larkin,et al.  Efficient nonlinear algorithm for envelope detection in white light interferometry , 1996 .

[5]  Mervyn J Miles,et al.  Ultrahigh-speed scanning near-field optical microscopy capable of over 100 frames per second , 2003 .

[6]  Eric Fogarassy,et al.  Large area, high resolution analysis of surface roughness of semiconductors using interference microscopy , 2002 .

[7]  P. J. Caber Interferometric profiler for rough surfaces. , 1993, Applied optics.

[8]  Reda Yahiaoui,et al.  3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope , 2001 .

[9]  P. C. Montgomery,et al.  Real-time high-resolution topographic imagery using interference microscopy , 2002 .

[10]  Eric Fogarassy,et al.  Interference microscopy for nanometric surface microstructure analysis in excimer laser processing of silicon for flat panel displays , 2003 .

[11]  Y. Reibel,et al.  CCD or CMOS camera noise characterisation , 2003 .

[12]  J P Fillard,et al.  Near Field Optics and Nanoscopy , 1996 .

[13]  Paul C. Montgomery,et al.  Peak fringe scanning microscopy: submicron 3D measurement of semiconductor components , 1993, Optics & Photonics.

[14]  A. Olszak,et al.  Lateral scanning white-light interferometer. , 2000, Applied optics.