Real-time measurement of microscopic surface shape using high-speed cameras with continuously scanning interference microscopy
暂无分享,去创建一个
[1] Manuel Flury,et al. Rapid prototyping of diffractive optical elements for high-power lasers using laser ablation lithography fabrication and coherence probe microscopy analysis , 2002 .
[2] Yann Reibel. Développement et caractérisation d'une caméra vidéo numérique rapide (500 I/S) à haute résolution (10 BITS) : application à la reconstruction 3D de surfaces microscopiques , 2001 .
[3] A C Boccara,et al. Real-time reflectivity and topography imagery of depth-resolved microscopic surfaces. , 1999, Optics letters.
[4] Kieran G. Larkin,et al. Efficient nonlinear algorithm for envelope detection in white light interferometry , 1996 .
[5] Mervyn J Miles,et al. Ultrahigh-speed scanning near-field optical microscopy capable of over 100 frames per second , 2003 .
[6] Eric Fogarassy,et al. Large area, high resolution analysis of surface roughness of semiconductors using interference microscopy , 2002 .
[7] P. J. Caber. Interferometric profiler for rough surfaces. , 1993, Applied optics.
[8] Reda Yahiaoui,et al. 3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope , 2001 .
[9] P. C. Montgomery,et al. Real-time high-resolution topographic imagery using interference microscopy , 2002 .
[10] Eric Fogarassy,et al. Interference microscopy for nanometric surface microstructure analysis in excimer laser processing of silicon for flat panel displays , 2003 .
[11] Y. Reibel,et al. CCD or CMOS camera noise characterisation , 2003 .
[12] J P Fillard,et al. Near Field Optics and Nanoscopy , 1996 .
[13] Paul C. Montgomery,et al. Peak fringe scanning microscopy: submicron 3D measurement of semiconductor components , 1993, Optics & Photonics.
[14] A. Olszak,et al. Lateral scanning white-light interferometer. , 2000, Applied optics.