Assisted Coverage Closure
暂无分享,去创建一个
Daniel Kroening | Adam Nellis | Peter Schrammel | Michael Tautschnig | Philippa Ryan Conmy | Pascal Kesseli | D. Kroening | P. Schrammel | Michael Tautschnig | P. Conmy | A. Nellis | Pascal Kesseli
[1] Daniel Kroening,et al. A Tool for Checking ANSI-C Programs , 2004, TACAS.
[2] Nancy G. Leveson,et al. An empirical evaluation of the MC/DC coverage criterion on the HETE-2 satellite software , 2000, 19th DASC. 19th Digital Avionics Systems Conference. Proceedings (Cat. No.00CH37126).
[3] Mary Jean Harrold,et al. Test-Suite Reduction and Prioritization for Modified Condition/Decision Coverage , 2003, IEEE Trans. Software Eng..
[4] Neelam Gupta,et al. A concept analysis inspired greedy algorithm for test suite minimization , 2005, PASTE '05.
[5] John A. Clark,et al. Automatic Test Data Generation for Multiple Condition and MCDC Coverage , 2009, 2009 Fourth International Conference on Software Engineering Advances.
[6] Leanna Rierson,et al. Developing Safety-Critical Software: A Practical Guide for Aviation Software and DO-178C Compliance , 2013 .
[7] Raimund Kirner,et al. Error Detection Rate of MC/DC for a Case Study from the Automotive Domain , 2010, SEUS.
[8] Daniel Kroening,et al. Chaining Test Cases for Reactive System Testing , 2013, ICTSS.
[9] Daniel Kroening,et al. Efficient Computation of Recurrence Diameters , 2003, VMCAI.
[10] I. Toyn,et al. Proof vs testing in the context of safety standards , 2005, 24th Digital Avionics Systems Conference.
[11] Mary Sheeran,et al. Checking Safety Properties Using Induction and a SAT-Solver , 2000, FMCAD.
[12] Gordon Fraser,et al. Testing with model checkers: a survey , 2009, Softw. Test. Verification Reliab..
[13] Helmut Veith,et al. FShell: Systematic Test Case Generation for Dynamic Analysis and Measurement , 2008, CAV.
[14] Mark Harman,et al. An Analysis and Survey of the Development of Mutation Testing , 2011, IEEE Transactions on Software Engineering.
[15] Armin Biere,et al. Symbolic Model Checking without BDDs , 1999, TACAS.
[16] Z. ZamliKamal,et al. On Test Case Generation Satisfying the MC/DC Criterion , 2013 .