Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives
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Dušan Hemzal | Maria Losurdo | Ottilia Saxl | Kurt Hingerl | Christoph Cobet | Michael Bergmair | Razvigor Ossikovski | Denis Cattelan | Rados Gajic | Giovanni Bruno | Norbert Esser | Antonello de Martino | C. Cobet | N. Esser | A. de Martino | G. Bruno | R. Ossikovski | J. Humlíček | M. Losurdo | M. Bergmair | D. Cattelan | K. Fleischer | Z. Dohcevic-Mitrovic | Melanie Galliet | R. Gajić | D. Hemzal | K. Hingerl | Z. Popović | O. Saxl | Karsten Fleischer | Zorana Dohcevic-Mitrovic | Melanie Galliet | Josef Humlicek | Zoran V. Popovic
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