A Pollution Classification Algorithm Using Remote Sensing Images as Input

A semiconductor device comprises a lower wiring layer, an intermediate insulating film on the lower wiring layer and an upper wiring layer crossing the lower wiring layer via the intermediate insulating film. At least one opening is provided in the intermediate insulating film in the vicinity of the upper wiring layer but separated from the upper wiring layer to expose a surface portion of the lower wiring layer. In such a structure, when an electrical current flows through the lower wiring layer with a high density, whiskers or hillocks from the lower wiring layer grow definitively only in the opening, and hardly glow from a portion of the lower wiring layer under the upper wiring layer. Therefore, unwanted short-circuiting between the lower and upper wiring layers can be prevented.