Excitation optimization in fault diagnosis of analog electronic circuits

This article describes optimization of excitation signal for purpose of fault diagnosis. The goal is to enhance efficiency of faults detection in analog electronic circuits. The method has been verified on cases with single hard (catastrophic) and soft (parametric) faults. Further enhancement of fault detection efficiency has been achieved with additional feature extraction by means of wavelet transform. Obtained results have been compared with diagnosis using step function excitation and diagnosis without feature extraction.