Measurements Of X-Ray Fluorescence Yields Of Plastics By Photoexcitation

With the recent compilation of the low-energy x-ray photoabsorption and scattering factors, it has become more practical to determine low-energy x-ray fluorescence yields and to check the scattering cross sections of materials by x-ray photoexcitation. The x-ray fluorescence yield measurements of carbon in polypropylene, oxygen in mylar, and fluorine in polytetrafluorethylene (teflon), by Al x-ray photoexcitation will be presented. Also a comparison of calculated to observed Al Ka x-ray scattering from these plastics will be presented.