Summary: The encapsulation method of crystalline silicon modules plays an important role in the mitigation of potential induced degradation (PID) on module level. The focus on this work is to identify possibilities of mitigating PID for selective emitter cell technologies by the means of new module designs without the necessity of cell level modifications. In this paper we present different frontcover and encapsulation materials, which have been tested in different module layouts. We predominantly examined innovative laminate configurations allowing for higher transmission rates in the UV range and thus increasing short circuit currents (ISC) of selective emitter cells. We examined these performance (PMPP) enhancements consisting in higher optical transmission in relation to its resistance against PID. As a result of this assessment we show new module designs, which are both capable to improve module efficiencies while avoiding PID effects. Furthermore, different EVAs have been tested regarding their PID. For more Information on the topic please contact the R&D Team of PI Berlin.