A Novel Piezoelectric Strain Sensor for Simultaneous Damping and Tracking Control of a High-Speed Nanopositioner
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[1] Tien-Fu Lu,et al. Review of circular flexure hinge design equations and derivation of empirical formulations , 2008 .
[2] Sergej Fatikow,et al. Towards Automated Nanoassembly With the Atomic Force Microscope: A Versatile Drift Compensation Procedure , 2009 .
[3] Ephrahim Garcia,et al. A Self-Sensing Piezoelectric Actuator for Collocated Control , 1992 .
[4] S O Reza Moheimani,et al. Making a commercial atomic force microscope more accurate and faster using positive position feedback control. , 2009, The Review of scientific instruments.
[5] T. Ando,et al. High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes , 2008 .
[6] Toshio Ando,et al. Active damping of the scanner for high-speed atomic force microscopy , 2005 .
[7] T.-J. Yeh,et al. Modeling and Identification of Hysteresis in Piezoelectric Actuators , 2006 .
[8] J. L. Fanson,et al. Positive position feedback control for large space structures , 1987 .
[9] S O Reza Moheimani,et al. Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challenges. , 2008, The Review of scientific instruments.
[10] S. O. Reza Moheimani,et al. Integral resonant control of collocated smart structures , 2007 .
[11] C. Su,et al. An Analytical Generalized Prandtl–Ishlinskii Model Inversion for Hysteresis Compensation in Micropositioning Control , 2011, IEEE/ASME Transactions on Mechatronics.
[12] Chia-Hsiang Menq,et al. Control of a Two-Axis Micromanipulator-Based Scanning Probe System for 2.5-D Nanometrology , 2010, IEEE/ASME Transactions on Mechatronics.
[13] Paul K. Hansma,et al. Design and input-shaping control of a novel scanner for high-speed atomic force microscopy , 2008 .
[14] Andrew J. Fleming,et al. Dual-Stage Vertical Feedback for High-Speed Scanning Probe Microscopy , 2011, IEEE Transactions on Control Systems Technology.
[15] Toshio Ando,et al. Tip-sample distance control using photothermal actuation of a small cantilever for high-speed atomic force microscopy. , 2007, The Review of scientific instruments.
[16] Joseph Edward Shigley,et al. Mechanical engineering design , 1972 .
[17] A. Fleming,et al. Evaluation of charge drives for scanning probe microscope positioning stages , 2008, 2008 American Control Conference.
[18] G. Schitter,et al. Active Damping of a Piezoelectric Tube Scanner using Self-Sensing Piezo Actuation. , 2010, Mechatronics : the science of intelligent machines.
[19] Andrew J. Fleming,et al. Integrated strain and force feedback for high-performance control of piezoelectric actuators , 2010 .
[20] Yuen Kuan Yong,et al. Design, Identification, and Control of a Flexure-Based XY Stage for Fast Nanoscale Positioning , 2009, IEEE Transactions on Nanotechnology.
[21] M. Miles,et al. Real-time nanofabrication with high-speed atomic force microscopy , 2009, Nanotechnology.
[22] Santosh Devasia,et al. A Survey of Control Issues in Nanopositioning , 2007, IEEE Transactions on Control Systems Technology.
[23] Santosh Devasia,et al. Feedback-Linearized Inverse Feedforward for Creep, Hysteresis, and Vibration Compensation in AFM Piezoactuators , 2007, IEEE Transactions on Control Systems Technology.
[24] S. O. Reza Moheimani,et al. Control orientated synthesis of high-performance piezoelectric shunt impedances for structural vibration control , 2005, IEEE Transactions on Control Systems Technology.
[25] A.J. Fleming. Nanopositioning System With Force Feedback for High-Performance Tracking and Vibration Control , 2010, IEEE/ASME Transactions on Mechatronics.
[26] S. O. Reza Moheimani,et al. Reducing Cross-Coupling in a Compliant XY Nanopositioner for Fast and Accurate Raster Scanning , 2010, IEEE Transactions on Control Systems Technology.
[27] Karl Johan Åström,et al. Design and Modeling of a High-Speed AFM-Scanner , 2007, IEEE Transactions on Control Systems Technology.
[28] Qingze Zou,et al. A review of feedforward control approaches in nanopositioning for high-speed spm , 2009 .
[29] I.A. Mahmood,et al. Tracking Control of a Nanopositioner Using Complementary Sensors , 2009, IEEE Transactions on Nanotechnology.
[30] D. Croft,et al. Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application , 2000, Proceedings of the 2000 American Control Conference. ACC (IEEE Cat. No.00CH36334).
[31] R. Oliver. Advances in AFM for the electrical characterization of semiconductors , 2008 .
[32] Toshio Ando,et al. High-speed AFM and nano-visualization of biomolecular processes , 2008, Pflügers Archiv - European Journal of Physiology.
[33] J. Sirohi,et al. Fundamental Understanding of Piezoelectric Strain Sensors , 1999, Smart Structures.
[34] L. Ljung,et al. Subspace-based multivariable system identification from frequency response data , 1996, IEEE Trans. Autom. Control..
[35] G. Jayanth,et al. Modeling and Design of a Magnetically Actuated Two-Axis Compliant Micromanipulator for Nanomanipulation , 2010, IEEE/ASME Transactions on Mechatronics.
[36] K. Leang,et al. Design and Control of a Three-Axis Serial-Kinematic High-Bandwidth Nanopositioner , 2012, IEEE/ASME Transactions on Mechatronics.
[37] J. Pang,et al. AFM image reconstruction for deformation measurements by digital image correlation , 2006, Nanotechnology.
[38] J. A. Castellanos,et al. Flatness-Based Active Vibration Control for Piezoelectric Actuators , 2013, IEEE/ASME Transactions on Mechatronics.
[39] Sumeet S Aphale,et al. A New Method for Robust Damping and Tracking Control of Scanning Probe Microscope Positioning Stages , 2010, IEEE Transactions on Nanotechnology.
[40] S. O. Reza Moheimani,et al. Sensor fusion for improved control of piezoelectric tube scanners , 2007, 2007 IEEE/ASME international conference on advanced intelligent mechatronics.
[41] Hwee Choo Liaw,et al. Neural Network Motion Tracking Control of Piezo-Actuated Flexure-Based Mechanisms for Micro-/Nanomanipulation , 2009, IEEE/ASME Transactions on Mechatronics.
[42] G. Binnig,et al. Single-tube three-dimensional scanner for scanning tunneling microscopy , 1986 .