Tan delta measurement of paper insulated laminates using capacitance method from 300kHz to 50MHz

Tan delta measurement of oil impregnated kraft paper extracted from paper insulated lead covered cables (PILC) has been performed using a parallel plate capacitor and a vector network analyzer (VNA) from 30 kHz to 50 MHz. The material under test (MUT) is flat and thin sample clamped between the capacitor plates and connected to the VNA to obtain its two port S parameters. The S parameter is converted into impedance to calculate the complex permittivity using Matlab program. Techniques used to overcome the air gap and stray capacitance was described. Measurement obtained using the proposed method was compared with the free space method to validate its accuracy. The percent difference is less than 5%.

[1]  U. Hasar,et al.  A microwave method based on amplitude-only reflection measurements for permittivity determination of low-loss materials , 2010 .

[2]  M. Brodwin,et al.  Influence of wall contacts on measured complex permittivity spectra at coaxial line frequencies , 1991 .

[3]  Jyh Sheen,et al.  Study of microwave dielectric properties measurements by various resonance techniques , 2005 .

[4]  A. J. Bur,et al.  Two-terminal dielectric measurements up to 6 x 108 Hz , 1965 .

[5]  V. Varadan,et al.  A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies , 1989 .

[6]  J. Mosig,et al.  Dielectric measurements of tropical wood , 2010 .

[7]  W. Moon,et al.  A new linear encoder-like capacitive displacement sensor , 2006 .

[8]  Determination of the complex permittivity of materials with transmission/reflection measurements in rectangular waveguides ☆ , 2006 .

[9]  Nikola Rajaković,et al.  A new accelerated aging procedure for cable life tests , 1996 .

[10]  H. Ahmad,et al.  Ageing studies on transmission line glass insulators using dielectric dissipation factor test , 2010, 2010 Conference Proceedings IPEC.

[11]  H. Paudyal,et al.  Microwave cavity technique to study the dielectric response in 4′-n-Heptyl-4-biphenyl nematic liquid crystal at 20.900 GHz and 29.867 GHz , 2011 .

[12]  Measurement of Dielectric Material Properties Application Note , 2012 .

[13]  Chandan Kumar Chakrabarty,et al.  Phase detection using AD8302 evaluation board in the superheterodyne microwave interferometer for line average plasma electron density measurements , 2007 .

[14]  Zulkifly Abbas,et al.  Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide , 2001, IEEE Trans. Instrum. Meas..

[15]  D. Pamu,et al.  Determination of dielectric constant and loss of high-K thin films in the microwave frequencies , 2010 .