论文信息 - A complete measurement Test-Set for non-linear device characterization

A complete measurement Test-Set for non-linear device characterization

A novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.

Andrea Ferrero | Valeria Teppati

[1] Gunter Kompa,et al. Error-corrected large-signal waveform measurement system combining network analyzer and sampling oscilloscope capabilities , 1990 .

[2] Paul J. Tasker,et al. High power time domain measurement system with active harmonic load-pull for high efficiency base station amplifier design , 2000, IMS 2000.

[3] Andrea Pierenrico Ferrero,et al. An improved calibration technique for on-wafer large-signal transistor characterization , 1993 .

[4] S. Perlow,et al. Automatic Load Contour Mapping for Microwave Power Transistors , 1974 .

[5] J.-P. Lanteri,et al. A high power on-wafer pulsed active load pull system , 1992, 1992 IEEE Microwave Symposium Digest MTT-S.

[6] F. Verbeyst,et al. VIOMAP, the S-parameter equivalent for weakly nonlinear RF and microwave devices , 1994 .

[7] Denis Barataud,et al. Measurements of time-domain voltage/current waveforms at RF and microwave frequencies based on the use of a vector network analyzer for the characterization of nonlinear devices-application to high-efficiency power amplifiers and frequency-multipliers optimization , 1998, IEEE Trans. Instrum. Meas..