论文信息 - A current conveyor based BIC sensor for current monitoring in mixed-signal circuits

A current conveyor based BIC sensor for current monitoring in mixed-signal circuits

Quiescent current monitoring is considered as an interesting and efficient technique for mixed-signal testing, where fault detection of analog parts requires the precise measure of the I/sub ddq/. This paper presents a very simple current sensor for on-chip current monitoring giving an accurate analog output proportional to the quiescent current. The proposed circuit is based on a second generation current conveyor. Experimental results show the functionality of the proposed configuration and its linear output characteristic.

Alkis A. Hatzopoulos | Stylianos Siskos | Marise Bafleur | Th. Laopoulos

[1] Stylianos Siskos,et al. CMOS current conveyor , 1992 .

[2] R. D. McLeod,et al. Built-in current mode circuits for I/sub ddq/ monitoring , 1993, Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93.

[3] Alkis A. Hatzopoulos,et al. Supply current testing in linear bipolar ICs , 1994 .

[4] Ching-Wen Hsue,et al. Built-in current sensor for I/sub DDQ/ test in CMOS , 1993, Proceedings of IEEE International Test Conference - (ITC).

[5] A. Abidi,et al. A 50 dB variable gain amplifier using parasitic bipolar transistors in CMOS , 1988, Symposium 1988 on VLSI Circuits.

[6] Wojciech Maly,et al. Design of ICs applying built-in current testing , 1992, J. Electron. Test..

[7] Zhenhua Wang. Current mode analog integrated circuits and linearization techniques in CMOS technology , 1990 .

[8] Ching-Wen Hsue,et al. Built-In Current Sensor for IDDQ Test in CMOS , 1993 .