An SEM based system for a complete characterization of latch-up in CMOS integrated circuits
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Enrico Zanoni | Massimo Vanzi | Fausto Fantini | C. Canali | M. Giannini | M. Vanzi | C. Canali | F. Fantini | E. Zanoni | M. Giannini | A. Senin | A. Senin
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