Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution
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A. Tonomura | H. Shinada | M. Haider | Yoshio Takahashi | H. Müller | T. Tanigaki | T. Akashi | N. Osakabe | T. Shimakura | T. Kawasaki | T. Furutsu