论文信息 - Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited) - 字舞流文

Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited)

C. Carabasse | F. Andrieu | J. Coignus | S. Kerdilès | L. Grenouillet | T. Magis | M. Bedjaoui | S. Minoret | C. Jahan | C. Boixaderas | S. Martin | J. Barbot | L. Grenouillet | J. Barbot | J. Laguerre | S. Martin | C. Carabasse | M. Louro | M. Bedjaoui | S. Minoret | S. Kerdilès | C. Boixaderas | T. Magis | C. Jahan | F. Andrieu | J. Coignus | J. Laguerre | M. Louro