Strain and compositional fluctuations in Al0.81In0.19N/GaN heterostructures

The strain and compositional fluctuations of nearly lattice-matched Al0.81In0.19N/GaN heterostructures are investigated by cross-sectional scanning tunneling microscopy and selected area electron diffraction measurements in scanning electron transmission microscopy. The presence of strain induces height modulations governed by different roughness components at the cleavage surfaces. The surface height modulations are compatible with a relaxation of alternatingly compressive and tensile strained domains, indicating compositional fluctuations. Changes of the a lattice constant are traced to interface misfit edge dislocations. The dislocations induce steps increasing the roughness within the Al0.81In0.19N layers.

[1]  H. Eisele,et al.  Intrinsic electronic properties of high-quality wurtzite InN , 2016 .

[2]  M. Shur,et al.  Transient photoreflectance of AlInN/GaN heterostructures , 2012 .

[3]  M. Shur,et al.  Photoexcited carrier dynamics in AlInN/GaN heterostructures , 2012 .

[4]  Eric Feltin,et al.  Stress-modulated composition in the vicinity of dislocations in nearly lattice matched Al x In 1 − x N/GaN heterostructures: A possible explanation of defect insensitivity , 2011 .

[5]  J. Carlin,et al.  Strain compensation in AlInN/GaN multilayers on GaN substrates: Application to the realization of defect-free Bragg reflectors , 2011 .

[6]  T. Suski,et al.  Influence of indium clustering on the band structure of semiconducting ternary and quaternary nitride alloys , 2009 .

[7]  Jeremy J. Baumberg,et al.  Current status of AlInN layers lattice-matched to GaN for photonics and electronics , 2007 .

[8]  Marc Ilegems,et al.  Progress in AlInN-GaN Bragg reflectors: Application to a microcavity light emitting diode , 2005 .

[9]  Marc Ilegems,et al.  Crack-free fully epitaxial nitride microcavity using highly reflective AlInN∕GaN Bragg mirrors , 2005 .

[10]  Jerry R. Meyer,et al.  Band parameters for nitrogen-containing semiconductors , 2003 .

[11]  J. Carlin,et al.  High-quality AlInN for high index contrast Bragg mirrors lattice matched to GaN , 2003 .

[12]  E. Weber,et al.  Dopant atom clustering and charge screening induced roughness of electronic interfaces in GaAs p-n multilayers , 2002 .

[13]  Eugene E. Haller,et al.  Unusual properties of the fundamental band gap of InN , 2002 .

[14]  Isamu Akasaki,et al.  Anomalous features in the optical properties of Al1−xInxN on GaN grown by metal organic vapor phase epitaxy , 2000 .

[15]  R. Feenstra Comparison of electronic and mechanical contrast in scanning tunneling microscopy images of semiconductor heterojunctions , 1999 .

[16]  H. Eisele,et al.  Cross-sectional STM study of InAs quantum dots for laser devices , 1999 .

[17]  R. Goldman,et al.  Strain variations in InGaAsP/InGaP superlattices studied by scanning probe microscopy , 1998 .

[18]  Isamu Akasaki,et al.  Pit formation in GaInN quantum wells , 1998 .

[19]  Wang,et al.  Interface roughness and asymmetry in InAs/GaSb superlattices studied by scanning tunneling microscopy. , 1994, Physical review letters.

[20]  J. M. Gibson,et al.  The effects of elastic relaxation on transmission electron microscopy studies of thinned composition-modulated materials , 1986 .

[21]  P. Ebert,et al.  Correction of nonlinear lateral distortions of scanning probe microscopy images. , 2014, Ultramicroscopy.