Monitoring Copper and Silver Corrosion in Different Museum Environments by Electrical Resistance Measurement
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Michel Dubus | Jim Tate | M. Kouril | T. Prosek | Thi-Phuong Nguyen | J. Tate | M. Kouřil | T. Prošek | Mandana Saheb | M. Saheb | Thi-Phuong Nguyen | M. Dubus
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