Design and automation of electrical cable harnesses testing system

Abstract The design, development and application of an automated electrical cable harness testing system (ECHTS) with the capability of testing diverse cable harness configurations is presented. The ECHTS is able to test up to 32 conductors via an interchangeable connector, expandable to an additional 32 conductors through the use of an expansion board, detecting open- and short- circuit and incorrect pinning in a harness under test. The use of an LCD screen to display the status of a harness ensures faults are easily understood and displayed in the ECHTS, while providing a more comprehensive communication of detected faults compared to conventional testing and/or measurement systems. Compared to conventional systems, the ECHTS showed an improvement of testing times for a 1:1 and a one-to-multiple connector configuration, to 73% and a 15%, respectively, and a short operator's learning time.

[1]  A. Macdonald,et al.  A measurement of the electrostatic voltage, capacitance and energy storage characteristics of the human body. , 1977, Physics in medicine and biology.

[2]  Daniel C. Edelstein,et al.  Copper Metallization for High Performance Silicon Technology , 2000 .

[3]  Stefano Tonchia,et al.  Manufacturing flexibility: A literature review , 1998 .

[4]  C. D. Root,et al.  Design calculations for MOS field effect transistors , 1964 .

[5]  G. W. Brown Accurate voltage reference systems , 1961 .

[6]  J. Black Electromigration failure modes in aluminum metallization for semiconductor devices , 1969 .

[7]  Carlos A. Pomalaza-Raez,et al.  Automation of Electrical Cable Harnesses Testing , 2017, Robotics.

[8]  Anna Burduk,et al.  The use of a hybrid model of the expert system for assessing the potentiality of manufacturing the assumed quantity of wire harnesses , 2019 .

[9]  C. James Dahn,et al.  Requirements for a minimum ignition energy standard , 2003 .

[10]  L. Arroja,et al.  Wiring in the automobile industry: Life cycle assessment of an innovative cable solution , 2018, Journal of Cleaner Production.

[11]  C. Duvvury,et al.  ESD: a pervasive reliability concern for IC technologies , 1993 .

[12]  Luca Benini,et al.  Design Issues and Considerations for Low-Cost 3-D TSV IC Technology , 2010, IEEE Journal of Solid-State Circuits.

[13]  H. B. Benton Small, Lightweight Ionization Gauge Control Circuit , 1959 .

[14]  Robert J. Vokurka,et al.  A review of empirical research on manufacturing flexibility , 2000 .

[15]  Toshio Oishi ELECTROSTATIC DISCHARGE IMPACT ON ELECTRICAL/ELECTRONIC DEVICES, COMPONENTS, ASSEMBLIES, AND EQUIPMENT , 1979 .

[16]  F. Leens,et al.  An introduction to I2C and SPI protocols , 2009, IEEE Instrumentation & Measurement Magazine.

[17]  E. Cartier,et al.  Stressing and high field transport studies on device‐grade SiO2 by ballistic electron emission spectroscopy , 1996 .

[18]  Jeremy Dawson,et al.  Automated testing of electrical cable harnesses , 2018, 2018 13th IEEE Conference on Industrial Electronics and Applications (ICIEA).