Exploratory Nondestructive Evaluation (NDE) Research for Advanced Materials and Processes. Volume 1: High Resolution Computed Tomography for Failure Analysis.

Abstract : High Resolution Computed Tomography (CT) for Failure Analysis: Failure analysis is an essential element of all engineered products. The goal of failure analysis is the understanding of root causes of any undesirable effects. High resolution computed tomography offers detailed information on the internal assembly and material condition of objects under failure analysis investigation allowing accurate interpretation of effects not detectable by other means. Failure analysis using CT investigations are improved in technical accuracy at a reduced schedule and cost over alternative approaches. The cost of a high resolution CT system is often difficult to justify for CT applications only. However, when the system provides high resolution radioscopic imaging as well as CT, the cost justification is favorable. To achieve a combination high resolution radioscopic and CT system, a microfocus X-ray source is used. A versatile microfocus radioscopic system with CT capability has been successfully implemented as a standard tool in an aerospace failure analysis laboratory whose budget is in the range of $1 M/year. Using this tool, studies of electronic, electromechanical and composite material items have been performed. Such a system pays for itself within 2 years through higher productivity of the laboratory, increased laboratory value to the company and timely resolution of critical problems.