Large-scale statistical performance modeling of analog and mixed-signal circuits
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Wangyang Zhang | Xin Li | Fa Wang | Xin Li | Fa Wang | Wangyang Zhang
[1] Douglas C. Montgomery,et al. Response Surface Methodology: Process and Product Optimization Using Designed Experiments , 1995 .
[2] G. Debyser,et al. Efficient analog circuit synthesis with simultaneous yield and robustness optimization , 1998, 1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287).
[3] Radford M. Neal. Pattern Recognition and Machine Learning , 2007, Technometrics.
[4] Georges G. E. Gielen,et al. Template-Free Symbolic Performance Modeling of Analog Circuits via Canonical-Form Functions and Genetic Programming , 2009, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[5] Hong Zhang,et al. Efficient design-specific worst-case corner extraction for integrated circuits , 2009, 2009 46th ACM/IEEE Design Automation Conference.
[6] Sung-Mo Kang,et al. Worst-case analysis and optimization of VLSI circuit performances , 1995, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[7] Zhihua Wang,et al. An efficient yield optimization method using a two step linear approximation of circuit performance , 1994, Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC.
[8] Xin Li,et al. Statistical Performance Modeling and Optimization , 2007, Found. Trends Electron. Des. Autom..
[9] Lawrence T. Pileggi,et al. Asymptotic Probability Extraction for Nonnormal Performance Distributions , 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[10] Xin Li,et al. Finding Deterministic Solution From Underdetermined Equation: Large-Scale Performance Variability Modeling of Analog/RF Circuits , 2010, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[11] Margaret J. Robertson,et al. Design and Analysis of Experiments , 2006, Handbook of statistics.
[12] Robert H. Halstead,et al. Matrix Computations , 2011, Encyclopedia of Parallel Computing.
[13] Marcel J. M. Pelgrom,et al. Matching properties of MOS transistors , 1989 .
[14] Lawrence T. Pileggi,et al. Quadratic Statistical $MAX$ Approximation for Parametric Yield Estimation of Analog/RF Integrated Circuits , 2008, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[15] Zhuo Feng,et al. Performance-Oriented Statistical Parameter Reduction of Parameterized Systems via Reduced Rank Regression , 2006, 2006 IEEE/ACM International Conference on Computer Aided Design.
[16] Xin Li,et al. Statistical regression for efficient high-dimensional modeling of analog and mixed-signal performance variations , 2008, 2008 45th ACM/IEEE Design Automation Conference.
[17] Andrzej J. Strojwas,et al. Projection-based performance modeling for inter/intra-die variations , 2005, ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005..
[18] Xin Li,et al. Robust Analog/RF Circuit Design With Projection-Based Performance Modeling , 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[19] H. Graeb,et al. Mismatch analysis and direct yield optimization by spec-wise linearization and feasibility-guided search , 2001, Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232).
[20] Sani R. Nassif,et al. Modeling and analysis of manufacturing variations , 2001, Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169).
[21] Rob A. Rutenbar,et al. Beyond Low-Order Statistical Response Surfaces: Latent Variable Regression for Efficient, Highly Nonlinear Fitting , 2007, 2007 44th ACM/IEEE Design Automation Conference.
[22] R. H. Myers,et al. Response Surface Methodology: Process and Product Optimization Using Designed Experiments , 1995 .
[23] Janet Roveda,et al. Principle Hessian Direction-Based Parameter Reduction for Interconnect Networks With Process Variation , 2007, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[24] Eric R. Ziegel,et al. The Elements of Statistical Learning , 2003, Technometrics.
[25] Xin Li,et al. Finding deterministic solution from underdetermined equation: Large-scale performance modeling by least angle regression , 2009, 2009 46th ACM/IEEE Design Automation Conference.
[26] Glen Kramer,et al. Application-specific worst case corners using response surfaces and statistical models , 2004, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[27] Duane S. Boning,et al. Analysis and decomposition of spatial variation in integrated circuit processes and devices , 1997 .