Sensitivity factors for XPS analysis of surface atoms
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[1] C. Wagner. Sensitivity of detection of the elements by photoelectron spectrometry , 1972 .
[2] J. A. Taylor,et al. Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis , 1981 .
[3] M. Trzhaskovskaya,et al. Relative intensities in x-ray photoelectron spectra , 1973 .
[4] J. C. Ashley,et al. Electron inelastic mean free paths in several solids for 200 eV ⩽ E ⩽ 10 keV , 1982 .
[5] V. G. Yarzhemsky,et al. Relative intensities in x-ray photoelectron spectra. Part II☆ , 1975 .
[6] L. Davis,et al. The energy dependence of the electron mean free path , 1980 .
[7] R. H. West,et al. Sensitivity factors, cross-section and resolution data for use with the Si Kα X-ray source , 1980 .
[8] S. Evans,et al. Relative differential subshell photoionisation cross-sections (MgKα) from lithium to uranium , 1978 .
[9] R. S. Swingle. Quantitative surface analysis by x-ray photoelectron spectroscopy (ESCA) , 1975 .