Investigation of the electrical properties and reliability of amorphous SiCN
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C. C. Liu | Ting‐Chang Chang | Po-Tsun Liu | T. Tseng | Jianmin Chen | H. Huang | T. Tsai | C. W. Chen | C. Tseng
暂无分享，去创建一个
C. C. Liu | Ting‐Chang Chang | Po-Tsun Liu | T. Tseng | Jianmin Chen | H. Huang | T. Tsai | C. W. Chen | C. Tseng