Investigation of single event upset and total ionizing dose in FeRAM for medical electronic tag

We investigate the single event upset (SEU) and total ionizing dose (TID) tolerance of FeRAMs fabricated in 180-nm technology against neutron and gamma-ray radiation. Our irradiation tests reveal that the FeRAM has an SEU rate of less than 8.5 × 10 3 FIT/Gbit for terrestrial neutrons and a tolerance up to the dose of 100-kGy for gamma-ray radiation. These results indicate that the FeRAM is suitable for the medical electronic tags which require sterilization with 25-kGy ionization radiation.

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