Analytical solutions to electron imaging of head fields

Magnetic microstructural information of the stray field of a recording head may be obtained by Lorentz microscopy. This involves measuring the deflection, due to the Lorentz force, experienced by an electron as it passes through the stray field. Using a simplified model of a head, an analytical solution has been derived that gives the integrated Lorentz force experienced by an electron as it passes through the stray field of a thin-film recording head. >