Determination of the Cu 2p primary excitation spectra for Cu, Cu2O and CuO

article i nfo The shape and intensity of photoelectron peaks are strongly affected by extrinsic excitations due to electron transport out of the surface (including bulk and surface effects) and to intrinsic excitations due to the sudden creation of the static core hole. These effects must be included in the theoretical description of the emitted photoelectron spectra. We have calculated the effective energy-differential inelastic electron scattering cross section for XPS, including both surface and core hole effects, within the dielectric response theory by means of the QUEELS-XPS software (QUantitative analysis of Electron Energy Losses at Surfaces for XPS). The full XPS spectrum is then modeled by convoluting this energy loss cross section with the primary excitation spectrum that accounts for all effects which are part of the initial photo-excitation process, i.e. lifetime broadening, spin- orbit coupling, and multiplet splitting. The shape of this primary excitation spectrum is determined by requiring close agreement between the resulting theoretical spectrum and the experimental XPS spectrum. These calculations were performed for Cu 2p peaks of Cu, Cu2O, and CuO. For CuO, we compare the obtained primary excitation spectra with first principle calculations performed with the CTM4XAS software (Charge Transfer Multiplet program for X-ray Absorption Spectroscopy) for the corresponding emissions and we find good quantitative agreement.

[1]  J. Gervasoni,et al.  Energy loss and plasmon excitation during electron emission in the proximity of a solid surface , 1992 .

[2]  S. Tougaard Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging , 2010 .

[3]  F. Yubero,et al.  QUEELS software package for calculation of surface effects in electron spectra , 2004 .

[4]  G. Wertheim,et al.  Many-body processes in x-ray photoemission line shapes from Li, Na, Mg, and Al metals , 1977 .

[5]  F. Yubero,et al.  Contribution of intrinsic and extrinsic excitations to KLL Auger spectra induced from Ge films. , 2004 .

[6]  P. Sigmund,et al.  Influence of elastic and inelastic scattering on energy spectra of electrons emitted from solids , 1982 .

[7]  F. D. de Groot,et al.  The CTM4XAS program for EELS and XAS spectral shape analysis of transition metal L edges. , 2010, Micron.

[8]  F. Yubero,et al.  Dielectric description of the angular dependence of the loss structure in core level photoemission , 2012 .

[9]  D. A. Shirley,et al.  High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of Gold , 1972 .

[10]  F. Yubero,et al.  Quantitative model of electron energy loss in XPS , 1997 .

[11]  F. Yubero,et al.  Quantification of plasmon excitations in core-level photoemission , 2005 .

[12]  M. C. Marco de Lucas,et al.  Vibrational Properties of CuO and Cu4O3 from First-Principles Calculations, and Raman and Infrared Spectroscopy , 2012 .

[13]  S. Tougaard,et al.  Electronic and optical properties of Cu, CuO and Cu2O studied by electron spectroscopy , 2012, Journal of physics. Condensed matter : an Institute of Physics journal.

[14]  L. Tjeng,et al.  Electronic structure of Cu2O and CuO. , 1988, Physical review. B, Condensed matter.

[15]  Software package to calculate the effects of the core hole and surface excitations on XPS and AES , 2012 .

[16]  F. Yubero,et al.  Test of dielectric-response model for energy and angular dependence of plasmon excitations in core-level photoemission , 2005 .

[17]  Sanz,et al.  Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence. , 1996, Physical review. B, Condensed matter.

[18]  P. Cheng,et al.  Effect of pulsing parameters on laser ablative cleaning of copper oxides , 2006 .

[19]  R. H. Ritchie,et al.  Electron excitation and the optical potential in electron microscopy , 1977 .

[20]  A. Kotani,et al.  Multiplet structure in core-level XPS OF HIGH-Tc material La2CuO4 and related Cu-compounds , 1990 .

[21]  D. Briggs,et al.  Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy , 2003 .

[22]  J. White,et al.  Copper oxide reduction through vacuum annealing , 2003 .

[23]  S. Tougaard Practical algorithm for background subtraction , 1989 .