Constant-stress Accelerated Degradation Testing of Satellite Assemblies

High reliability satellite requires the extremely high reliable assemblies over a long period of time. Within severe time constraints, this paper utilizes the accelerated degradation testing to evaluate their reliability and life. Firstly, the critical functional modular and its degraded failure mechanism of microwave radiometer Imager (MWRI) are analyzed to determine,the its accelerated model. Then, by modeling the degradation process as a drift Brown Motion of which the first passage time follows inverse Gaussian distribution, this paper generated the reliability model of the critical functional modular. Finally, the maximum likelihood combined with least square of accelerated degradation testing data is used to estimate the data from Monte Carlo simulation. The methodology in this paper is demonstrated and validated by reasonability of estimation of virtual HEMT.