A programmable BIST approach for the diagnosis of embedded memory cores
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Massimo Violante | Paolo Bernardi | Maurizio Rebaudengo | Matteo Sonza Reorda | D. Appello | V. Tancorre | A. Fudoli
[1] Alfredo Benso,et al. A programmable BIST architecture for clusters of multiple-port SRAMs , 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
[2] Paolo Bernardi,et al. A P1500-compatible programmable BIST approach for the test of embedded flash memories , 2003, 2003 Design, Automation and Test in Europe Conference and Exhibition.
[3] Elizabeth M. Rudnick,et al. Diagnostic testing of embedded memories using BIST , 2000, DATE '00.
[4] Yervant Zorian,et al. Towards a standard for embedded core test: an example , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
[5] Maurizio Rebaudengo,et al. A P1500 compliant architecture for BIST-based Diagnosis of embedded RAMs , 2001 .