Fundamental Data Processing for GEM Detector Measurement System Applied for X - ray Diagnostics of F

TRIPPLE-GAS ELECTRON MULTIPLIER (T-GEM) The X-ray T-GEM detectors [1, 2, 3] are based on collection of electrons created by direct ionization within the gas through application of a large electric field that initiates an electron avalanche. The multiplied space charge, which is injected to the final segment of the detector, so-called induction gap, and collected on the multi-strip plane, generates current anode signals detected by electronics. The structure of the detector is presented in Fig. 1.