X-Ray Scattering by Antiphase Ferroelectric Domain Walls in the Antiferroelectric Phase of the PbZr _0.985 Ti _0.015 O _3

The results of the X-ray diffuse scattering (DS) measurements of the Zr-rich PbZrO\(_{3}\) - PbTiO\(_{3}\) solid solution PbZr\(_{0.985}\)Ti\(_{0.015}\)O\(_3\) (PZT1.5) are presented. Measurements were performed in zero electric field and in applied electric field E = 5 kV / cm. In the antiferroelectric phase diffuse scattering streaks around \(\varSigma \) superstructure peaks \((h+\frac{1}{4}~k+\frac{1}{4}~l)\) were found and interpreted as a scattering on ferroelectric antiphase domain walls. This conclusion is corroborated by the observation of a strong influence of the electric field on these streaks. Reported results are important for the prospective application of the antiferroelectrics as the basis for the high-density non-volatile memory devices.

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