Linearity characterization of RF circuits through an unequally spaced multi-tone signal
暂无分享,去创建一个
Jacques Sombrin | Michel Prigent | Sylvain Laurent | Raymond Quere | J. Teyssier | R. Quéré | J. Sombrin | S. Laurent | M. Prigent | Jean Pierre Teyssier
[1] Dominique Schreurs,et al. Characterization of Intermodulation and Memory Effects Using Offset Multisine Excitation , 2014, IEEE Transactions on Microwave Theory and Techniques.
[2] Jacques B. Sombrin,et al. On the formal identity of EVM and NPR measurement methods: Conditions for identity of error vector magnitude and noise power ratio , 2011, 2011 41st European Microwave Conference.
[3] Jan Verspecht,et al. High power on-wafer capabilities of a time domain load-pull setup , 2008, 2008 IEEE MTT-S International Microwave Symposium Digest.
[4] Jacques Sombrin,et al. Linearity characterization of GaN HEMT technologies through innovative on-wafer multi-tone load-pull measurements , 2016, 2016 11th European Microwave Integrated Circuits Conference (EuMIC).
[5] T. Reveyrand,et al. Time domain envelope characterization of power amplifiers for linear and high efficiency design solutions , 2013, WAMICON 2013.
[6] R. Quere,et al. A test set-up for the analysis of multi-tone intermodulation in microwave devices , 2014, 84th ARFTG Microwave Measurement Conference.
[7] Jacques Sombrin,et al. A Multi-Tone Load Pull measurement system for on-wafer characterization of microwave power transistors , 2016, 2016 46th European Microwave Conference (EuMC).