One of the main disadvantages of using D-type double-edge triggered flip-flops (DET-FFs) in VLSI system design is the number of transistors required. Two new DET-FF circuits (one static, the other dynamic) are proposed in which the number of transistors is reduced to a number similar to that for classic single-edge triggered flip-flops (SET-FFs). Both new circuits not only behave correctly when operated at high frequency but also offer a good level of immunity to metastability problems (static) and race problems (dynamic), as well as presenting a simple straightforward layout. These considerations offer wider practical and economic applications for the use of DET-FFs in VLSI system design. >
[1]
Stephen H. Unger,et al.
Double-Edge-Triggered Flip-Flops
,
1981,
IEEE Transactions on Computers.
[2]
J. Yuan,et al.
Double-edge-triggered D-flip-flops for high-speed CMOS circuits
,
1991
.
[3]
Christer Svensson,et al.
High-speed CMOS circuit technique
,
1989
.
[4]
Lee-Sup Kim,et al.
Metastability of CMOS latch/flip-flop
,
1990
.
[5]
Hung-Hsiang Jonathan Chao,et al.
Behavior analysis of CMOS D flip-flops
,
1989
.
[6]
Milos D. Ercegovac,et al.
A novel CMOS implementation of double-edge-triggered flip-flops
,
1990
.