HCIT contrast performance sensitivity studies: simulation versus experiment

Using NASA’s High Contrast Imaging Testbed (HCIT) at the Jet Propulsion Laboratory, we have experimentally investigated the sensitivity of dark hole contrast in a Lyot coronagraph for the following factors: 1) Lateral and longitudinal translation of an occulting mask; 2) An opaque spot on the occulting mask; 3) Sizes of the controlled dark hole area. Also, we compared the measured results with simulations obtained using both MACOS (Modeling and Analysis for Controlled Optical Systems) and PROPER optical analysis programs with full three-dimensional near-field diffraction analysis to model HCIT’s optical train and coronagraph.

[1]  Fang Shi,et al.  Performance of TPF's high-contrast imaging testbed: modeling and simulations , 2006, SPIE Astronomical Telescopes + Instrumentation.

[2]  Amir Give'on,et al.  Studies of the effects of optical system errors on the HCIT contrast performance , 2011, Optical Engineering + Applications.

[3]  John E. Krist,et al.  Assessing the performance limits of internal coronagraphs through end-to-end modeling: a NASA TDEM study , 2011, Optical Engineering + Applications.

[4]  Joseph J. Green,et al.  Coronagraph contrast demonstrations with the high-contrast imaging testbed , 2004, SPIE Astronomical Telescopes + Instrumentation.

[5]  John E. Krist,et al.  Stability error budget for an aggressive coronagraph on a 3.8 m telescope , 2011, Optical Engineering + Applications.

[6]  Fang Shi,et al.  High contrast imaging testbed for the Terrestrial Planet Finder coronagraph , 2004, 2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720).

[7]  John E. Krist,et al.  PROPER: an optical propagation library for IDL , 2007, SPIE Optical Engineering + Applications.

[8]  Stuart B. Shaklan,et al.  HCIT broadband contrast performance sensitivity studies , 2012, Other Conferences.

[9]  Amir Give'on,et al.  Broadband wavefront correction algorithm for high-contrast imaging systems , 2007, SPIE Optical Engineering + Applications.