论文信息 - NANOMETER-SCALE IMAGING WITH AN ULTRAFAST SCANNING TUNNELING MICROSCOPE

NANOMETER-SCALE IMAGING WITH AN ULTRAFAST SCANNING TUNNELING MICROSCOPE

We present experimental data demonstrating the spatial resolution of an ultrafast junction mixing scanning tunneling microscope (JM-STM). The experiment uses a patterned metal-on-metal (Ti/Au) surface to establish electronic structure contrast on a short length scale. Our measurements achieve a spatio-temporal resolution of 20 nm–20 ps, limited only by the sample properties. The fine spatial resolution proves that the time-resolved signal is generated in the tunnel junction, indicating that atomic resolution should be possible in the JM-STM mode of operation.

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