Introductory guide to making Planar S-parameter measurements at millimetre-wave frequencies

This Introductory Guide aims to provide guidance to end users on implementing straightforward methods to perform reliable on-wafer calibration and measurement at millimetre-wave frequencies. High frequency on-wafer measurement is challenging and remains an active area of research. This guide will briefly review key considerations affecting the accuracy of measurement and these include experimental setup, choice of calibration methods, testing environment, crosstalk/isolation between probes, measurement verification, and design considerations for TRL calibration kits.