Exploring Effects of Electromagnetic Fault Injection on a 32-bit High Speed Embedded Device Microprocessor

Researchers already presented electromagnetic fault injection as an attack technique to change data and instruction execution in an electronic device. For a successful and reliable attack an attacker has to find a usable injections configuration. Therefore an attacker has to explore a range of available configuration parameters. To the best of our knowledge no summary and evaluation of glitch effect exploration techniques has been published yet. Furthermore no work has performed electromagnetic fault injection on a 32-bit target running with clock speeds above 500 Mhz. The aim of this thesis is to list and test these glitch effect exploration techniques on a 32-bit high speed embedded device microprocessor.

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