论文信息 - Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics

Study of radiation damage and substrate resistivity effects from beam test of silicon microstrip detectors using LHC readout electronics

Abstract We present the beam test results of single-sided silicon microstrip detectors, with different substrate resistivities. The effects of radiation damage are studied for a detector irradiated to a fluence of 2.4×10 14 n / cm 2 . The detectors are read out with the APV6 chip, which is compatible with the 40 MHz LHC clock. The performance of different detectors and readout modes are studied in terms of signal-to-noise ratio and efficiency.

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